SEM Instruments


SEM-1: Jeol JSM 5200

Specifications:

  • Imaging: secondary electron imaging; backscattered electron imaging
  • Resolution: 5,5 nm
  • Magnification: from 15X to 200,000X
  • Acceleration voltage: 1, 2, 5, 10, 15, 20, 25 kV
  • Digital image acquisition

SEM-2: Hitachi S-2400

Specifications:

  • Imaging: secondary electron imaging; backscattered electron imaging
  • Resolution: 10.0 nm
  • Magnification: from 20X to 300,000X
  • Acceleration voltage: 0.3-3 (0.1 kV step), 4-8 (1 kV step), 10, 12, 15, 18, 22, 25 kV
  • Digital image acquisition

SEM-3: Jeol JSM 5400

Specifications:

  • Imaging: secondary electron imaging; backscattered electron imaging
  • Chemical analysis by EDS detector, elemental distribution mapping
  • Resolution: 5,5 nm
  • Magnification: da 15X a 200,000X
  • Acceleration voltage: 1, 2, 5, 10, 15, 20, 25 kV
  • Digital image acquisition

SEM-4: Philips 515

Specifications:

  • Imaging: secondary electron imaging; backscattered electron imaging
  • Chemical analysis by EDS Si(Li) detector
  • Digital image acquisition

Some application examples


SEM-1, Biology
SEM-2, Biology
SEM-3, Mineralogy
SEM-3, Mineralogy