July 14, 2017 - Bologna

Dept. of Biological, Geological and Environmental Sciences
University of Bologna, Italy
Aula Magna di Anatomia Comparata, Via Selmi 3, (2° Piano) - Bologna


9.50-10.00 Welcome and opening address
Prof. Alessandro Gargini (Head of Dept. BiGeA-UniBo); Giovanni Valdrè (CME-BO/BiGeA-UniBo)

Contributions from University and CNR
10.00-10.20 A. Alessandrini (UniMoRe) - Atomic force microscopy investigation of the mechanical properties of neuroblastoma multiforme cells and their correlation with the migratory potential.
10.20-10.40 G. Zuccheri (UniBo) - Thin polymer layers on surfaces and block-copolymer self-assembly towards nanoelectronics and bioanalytics.
10.40-11.00 V. Palermo (ISOF-CNR) – Image processing of SPM data. A tool for metrology of graphene and other 2D materials.
11.00-11.20 G. Bussetti, R. Yivlialin, A. Li Bassi, C. S. Casari, M. Passoni, C. Castiglioni, M. Tommasini, L. Brambilla, L. Magagnin, A. Bossi, M. Penconi, M. Finazzi, F. Ciccacci and L. Duò (Politecnico di Milano) - Anion intercalation in graphite. Electrode evolution vs surface protection studied by a combined electrochemical scanning probe microscopy investigation.
11.20-11.40 C. Albonetti (ISMN-CNR, BO) - Organic islands growth on SiO2 surfaces as observed by SPM.

Innovations in Scanning Probe Microscopy:

11.40-13.20 Contributions from the companies (Morning session)
11.40-12.00 Bruker - M. Febvre: SPM High resolution, Nanomechanics and nano-surface chemistry (Nano Raman, Nano IR).
12.00-12.20 Gambetti Kenologia (Park) - S. Alberici: Scanning Ion Conductance Microscopy (SICM) Technology and Its Application.
12.20-12.40 Oxford Instruments/Asylum Research - J. Lopez: Full-Featured Video-Rate AFM.
12.40-13.00 Pra.Ma. (NT-MTD) - D. Kazantsev, V. Polyakov, S. Lemeshko, E. Kazantseva: Material contrast mapping with nanometer resolution by Apertureless Scanning Near-Field Microscopy.
13.00-13.20 Biofotonica (JPK) – P. Antonucci: AFM for tissues and cells investigation in medical field: technology and results.

13.20-14.40 Lunch Break

14:40 - 16:20 Contributions from the companies (Afternoon session)
14.40-15.00 Assing - S. Chiesa: Complementary Techniques for Measuring Surface Mechanical Properties at the Micro and Nanoscale.
15.00-15.20 LOT-QuantumDesign/Nanosurf – S. Schutzmann: Beyond AFM: Advanced Nanotechnology Tools for Materials and Life Sciences.
15.20-15.40 Keysight Technologies/Agilent – S. Pergolini: New developments in AFM Technology and in the Electrical Characterization of Surfaces at the Nanoscale.
15.40-16.00 Elbatech – M. Sartore: From Internet-of-Things to Laboratory tool.
16.00-16.20 Schaefer South-East Europe/CSInstruments – P. Martinez: Advanced AFM electrical nanocharacterization of 2-D materials and semiconductors.

16.20-16.40 – Coffee Break

Contributions from University
16.40-17.00 M. Marcaccio, S. Rapino (Ciamician-UniBo) – Probing Biological Systems and Nanostructured Materials by Scanning Electrochemical Microscopy.
17.00-17.20 T. Cramer, B. Fraboni (UniBo) - Atomic Force Microscopies to Study Electronic Properties and Strain in Thin Films for Flexible Electronics.
17.20-17.40 A. Simonelli, D. Moro, G. Ulian, G. Valdrè (BiGeA-UniBo) – Finite element analysis of probe-specimen interaction in SPM.

17.40 Concluding remarks

La partecipazione al workshop è gratuita ed è aperta a tutti (laureandi, dottorandi, ricercatori, tecnici, professionisti, ecc.)

Per registrarsi al Workshop inviare una mail di conferma a: giovanni.valdre@unibo.it